KE, Hong. KDSP-DEA-YOLO: Knowledge-Distillation-Guided Structured Pruning for Lightweight Industrial Surface Defect Detection. Artificial Intelligence and Digital Technology, [S. l.], v. 3, n. 4, p. 48–64, 2026. DOI: 10.70088/c66wm041. Disponível em: https://soapubs.com/index.php/AIDT/article/view/2961.. Acesso em: 4 oct. 2026.